| D/A |
digital to analog |
| D/B |
die bonding |
| DAC |
digital-to-analog converter |
| DAS |
direct absorption spectroscopy |
| DASSL |
differential algebraic system solver |
| DBMS |
database management system |
| DC |
direct current |
| DCA |
direct chip attachment |
| DCATS |
double-contained acid transfer system |
| DCE |
distributed computer environment |
| DCL |
digital command language; display communication log |
| DCS |
dichlorosilane |
| DDL |
device description language |
| DDMS |
defect data management system |
| DEDS |
discrete-event dynamic simulation |
| DES |
data encryption standard; display equipment status |
| DF |
darkfield |
| DFC |
densified fluid clean |
| DFE |
dual-frequency etch |
| DFM |
design for manufacturing |
| DFR |
design for reliability |
| DFT |
design for test |
| DFY |
design for yield |
| DHF |
dilute hydrofluoric acid |
| DI |
deionized; dielectric isolation |
| DIBL |
drain-induced barrier leakage |
| DIC |
differential interference contrast |
| DIL |
dual in-line |
| DIP |
dual in-line package |
| DLBI |
device-level burn-in |
| DLOC |
developed source lines of code |
| DLS |
display lot status |
| DLT |
device-level test |
| DLTS |
deep-level transient spectroscopy |
| DMA |
direct memory access; dynamic mechanical analysis |
| DMH |
display message helps |
| DML |
data manipulation language; display message log |
| DMM |
digital multimeter |
| DMOS |
diffused metal-oxide semiconductor |
| DMR |
display move requests |
| DO |
dynamic optimization |
| DOA |
dead-on alignment |
| DOAS |
differential optical absorption spectroscopy |
| DOE |
design of experiments |
| DOF |
depth of focus |
| DOP |
dioctylphthalate |
| DPA |
destructive physical analysis |
| DPM |
digital panel meter |
| DPP |
discharge-produced plasma |
| DPSRAM |
dual-port static random access memory |
| DRAM |
dynamic random access memory |
| DRAPAC |
Design Rule and Process Architecture Council |
| DRC |
design rule check |
| DRE |
destruction removal efficiency |
| DRIFTS |
diffuse reflectance infrared Fourier transform spectroscopy |
| DRT |
defect review tool |
| DSA |
display system activity; dimensionally stable anode |
| DSC |
differential scanning calorimetry |
| DSMC |
direct simulation Monte Carlo |
| DSQ |
downstream quartz |
| DSS |
display stocker status |
| DSW |
direct step-on-wafer |
| DT |
dynamic test |
| DTA |
differential thermal analysis |
| DTC |
direct thermocouple control |
| DTL |
diode transistor logic |
| DTM |
defect test monitor; delay time multiplier; device test module; digital terrain map |
| DTMPN |
defect test monitor phase number |
| DUT |
device under test |
| DUV |
deep ultraviolet |
| DV |
design verification |
| DVER |
design rule verification |
| DVM |
digital voltmeter |
| DVS |
display vehicle status |
| DWG |
domain work group |
| IDDQ |
direct drain quiescent current |
| Master |
Deliverables List |
